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Synopsys FPGA Platform: Enabling Faster Design, Verification and Debug of FPGAs

This white paper describes how the Synopsys FPGA Platform fulfills all requirements for development of the industry’s most advanced programmable devices. - August 2019

Accelerating Physical Verification Productivity for Advanced Node Designs ...

Mar 2019 - Learn how to increase productivity using IC Validator physical verification for advanced node designs.

TestMAX Family of Test Products

Mar 20, 2019 - The Synopsys TestMAX™ family of test products delivers innovative test and diagnostic capabilities for all digital, memory, and analog portions of a semiconductor device with unique ...

Accelerating Toshiba's SoC Design with Fusion Compiler

Feb 2019 - Learn how Toshiba's early access to the industry’s only RTL-to-GDSII solution speeds time-to-market for their latest, advanced, automotive SoC

Fusion Compiler Comprehensive RTL-to-GDSII Implementation System

Nov 2018 - The semiconductor industry is going through a renaissance period with waves of technological advancements and innovation...

Fusion Compiler Unified Physical Synthesis

Nov 2018 - Learn about the benefits of Fusion Compiler's unified optimization technologies that is enabling up to 20 percent improved performance, power and area (PPA ), while reducing ...

Synopsys Vision for the New Wave of Chip Design

Mar 2018 - Learn how the recent semiconductor industry shifts are breaking the traditional RTL-to-GDSII flow, and how the new Synopsys Fusion Technology helps you cross the chasm

Functional Safety for FPGA-Based Hardware Designs

Aug 2017 - Learn about the functional safety requirements defined by ISO 26262 for automotive and IEC 61508 for industrial applications that FPGA Designers are incorporating into their designs for ...

More Effective Test: Slack-Based Transition Delay

Jan 2017 - This white paper describes the basic principles related to SBTD, which is available in Synopsys’ synthesis-based test solution, DFTMAX and TetraMAX ATPG

The Path to (Virtually) Zero Defective Parts Per Million

Dec 2016 - Despite thorough wafer and package testing, a small number of defective ICs can make their way into systems. These test “escapes” often return as field failures, increasing costs and ...