DesignWare STAR Hierarchical System
Automated Hierarchical Test Solution for Efficiently Testing SoCs or Designs Using Multiple IP/cores
Comprehensive, Integrated Test, Repair and Diagnostics Solution That Supports Repairable or Nonrepairable Embedded Memories
Adaptive Scan Compression for Cost-effective DSM Testing
Synthesis-based In-System Self-Test
Ultra-high Compression for Maximum Test Cost Reduction
RTL Testability Analysis and Improvement
Next-Generation Automatic Test Pattern Generation and Diagnostics Solution
Design-centric Yield Management