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DesignWare STAR Hierarchical System

Automated Hierarchical Test Solution for Efficiently Testing SoCs or Designs Using Multiple IP/cores

DesignWare STAR Memory System

Comprehensive, Integrated Test, Repair and Diagnostics Solution That Supports Repairable or Nonrepairable Embedded Memories

DFTMAX

Adaptive Scan Compression for Cost-effective DSM Testing

DFTMAX LogicBIST

Synthesis-based In-System Self-Test

DFTMAX Ultra

Ultra-high Compression for Maximum Test Cost Reduction

SpyGlass DFT ADV

RTL Testability Analysis and Improvement

TetraMAX II

Next-Generation Automatic Test Pattern Generation and Diagnostics Solution

Yield Explorer

Design-centric Yield Management