Design-for-test rule checking and RTL fault coverage estimation capabilities that help designers pinpoint testability issues early in the flow
TestMAX ALE Adaptive High-Bandwidth Test
TestMAX ALE and TestMAX SLT form the solution that leverages high-speed interfaces such as a Universal Serial Bus (USB) and PCI Express that exist on many semiconductor devices.
Advanced Pattern Generation
Comprehensive, advanced design-for-test (DFT)
Unparalleled throughput for high resolution and accuracy of silicon defect candidate selection
Calculating ISO 26262 functional safety metrics to identify and address hotspots early in the design cycle and guide impactful design changes
A complete, integrated RTL to ATE implementation and verification flow
Comprehensive, integrated test, repair and diagnosis solution for embedded as well as external memories
Reads and reformats patterns and results for over 30 ATE and logic simulator formats
In-system self-test for safety critical designs including automotive, medical, and aerospace