In-Chip Monitoring Becoming Essential Below 10nm
May 20, 2019 - Complex interactions and power-related effects require understanding of how chips behave in context of real-world use cases.
Automotive, AI Drive Big Changes In Test
Apr 25, 2019 - DFT strategies are becoming intertwined with design strategies at the beginning of the design process.
Low Power Meets Variability At 7/5nm
Apr 11, 2019 - Reductions in voltage, margin and increases in physical effects are making timing closure and signoff much more difficult.
Building Bridges: A New DFT Paradigm
Mar 28, 2019 - Greater complexity and smaller process nodes are driving a major shift in design-for-test implementation
AI's Growing Impact on Chip Design
Jan 16, 2019 - Semiconductor Engineering interviews Aart de Geus to discuss the impact of AI on chip design.
Sep 6, 2018 - Race is on to grab a share of this growing market, but it’s not so simple.
Variation In Low-Power FinFET Designs
Aug 30, 2018 - Old solutions don’t necessarily work anymore, particularly at advanced nodes and ultra-low voltage.
Chip Aging Becomes Design Problem
Aug 09, 2018 - Assessing the reliability of a device requires adding more physical factors into the analysis, many of which are interconnected in complex ways
Aug 02, 2018 - Increasing robustness levels will require significant changes throughout the entire automotive ecosystem.
Auto Chip Ecosystem Needs Common Language
Aug 02, 2018 - To reach the levels of robustness that autonomous vehicles will require, companies throughout the auto and semiconductor ecosystems are working with an eye toward high-sigma design.