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Automotive, AI Drive Big Changes In Test

Apr 25, 2019 - DFT strategies are becoming intertwined with design strategies at the beginning of the design process.

Building Bridges: A New DFT Paradigm

Mar 28, 2019 - Greater complexity and smaller process nodes are driving a major shift in design-for-test implementation

In-Chip Monitoring Becoming Essential Below 10nm

May 20, 2019 - Complex interactions and power-related effects require understanding of how chips behave in context of real-world use cases.

Is 5 nm Testing the Same or Different

Apr 11, 2018 - What test methodologies and technologies must be applied to detect all manufacturing defects present in new process nodes such as 5 nm and beyond? If not captured at silicon test ...

In-System Automotive Test

Feb 1, 2018 - Chip designers employing in-system BIST techniques to test electronics installed in automobiles.

Fusion Improves Timing Say Synopsys Users

Jul 03, 2018 - Early-access customers talk about their experiences using Fusion Technology enabled portfolio of tools at DAC 2018.